JPS6410955U - - Google Patents

Info

Publication number
JPS6410955U
JPS6410955U JP10593987U JP10593987U JPS6410955U JP S6410955 U JPS6410955 U JP S6410955U JP 10593987 U JP10593987 U JP 10593987U JP 10593987 U JP10593987 U JP 10593987U JP S6410955 U JPS6410955 U JP S6410955U
Authority
JP
Japan
Prior art keywords
fluorescent display
chip
display section
display tube
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10593987U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10593987U priority Critical patent/JPS6410955U/ja
Publication of JPS6410955U publication Critical patent/JPS6410955U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
JP10593987U 1987-07-10 1987-07-10 Pending JPS6410955U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10593987U JPS6410955U (en]) 1987-07-10 1987-07-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10593987U JPS6410955U (en]) 1987-07-10 1987-07-10

Publications (1)

Publication Number Publication Date
JPS6410955U true JPS6410955U (en]) 1989-01-20

Family

ID=31339002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10593987U Pending JPS6410955U (en]) 1987-07-10 1987-07-10

Country Status (1)

Country Link
JP (1) JPS6410955U (en])

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167024A (ja) * 1983-03-14 1984-09-20 Nec Corp 集積回路バイアステスト方式
JPS6076673A (ja) * 1983-10-03 1985-05-01 Nec Corp 半導体装置の試験方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167024A (ja) * 1983-03-14 1984-09-20 Nec Corp 集積回路バイアステスト方式
JPS6076673A (ja) * 1983-10-03 1985-05-01 Nec Corp 半導体装置の試験方法

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